发明名称 TESTING EQUIPMENT FOR MICROPROCESSOR UNIT
摘要 PURPOSE:To acquire accurate synchronization only with one synchronizing signal, by using a phase detecting device to which the synchronizing signal from a test signal generating circuit and the synchronous output signal of a microprocessor unit (MPU) are inputted. CONSTITUTION:A synchronizing signal S21 from a test signal generating circuit 21 is supplied to one input of a phase detecting device 221. An output S22 of the phase detecting device 221 is supplied to the input of an integral network 222, and an output S23 of the integral network 222 is supplied to the input of a voltage control oscillating device 223. An output S24 of the voltage control oscillating device 223 is supplied to the input terminal of the oscillating circuit of an MPU 23. A synchronous output signal S25 of the MPU 23 is supplied to the other input of the phase detecting device 221. Other input and output terminals of the MPU 23 are connected to the test signal generating circuit 21.
申请公布号 JPS57193845(A) 申请公布日期 1982.11.29
申请号 JP19810077949 申请日期 1981.05.25
申请人 FUJITSU KK 发明人 TANEDA CHIKAMITSU
分类号 G06F11/22 主分类号 G06F11/22
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