发明名称 |
Surface impedance measuring apparatus. |
摘要 |
<p>The apparatus comprises a transmitting electrode (1) producing a magnetic field near the material to be tested and a receiving electrode (2) receiving the magnetic field. A frequency-wobulated voltage is applied to the transmitting electrode and a circuit measures the voltage at the terminals of the second electrode. So that the electrodes may be applied to the same side of the material to be tested (the material whose surface impedance is to be measured), the electrodes (1, 2) are superimposed with an intermediate dielectric block (3), thus forming a compact probe (SM). Measurements of the impedance are then independent of the dimensions and geometry of the material.
<IMAGE>
</p> |
申请公布号 |
EP0403344(A1) |
申请公布日期 |
1990.12.19 |
申请号 |
EP19900401578 |
申请日期 |
1990.06.08 |
申请人 |
OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES(O.N.E.R.A.);AVIONS MARCEL DASSAULT-BREGUET AVIATION (AMD/BA) |
发明人 |
GOBIN, VINCENT;LABAUNE, GERARD;ISSAC, FRANCOIS |
分类号 |
G01R27/02;G01R27/04 |
主分类号 |
G01R27/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|