发明名称 |
Process for fabricating small size electrodes in an integrated circuit |
摘要 |
According to the invention, a first layer of conductive material (11) is submitted to an incomplete etching operation in the presence of a mask (13). After elimination of the mask, a second layer of conductive material is deposited, and the thus-obtained result is submitted to an etching operation without a mask, so allowing the inter-electrode gaps to be reduced. The process provides a very tight electrode configuration, and is particularly suited to charge-coupled devices.
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申请公布号 |
US4968646(A) |
申请公布日期 |
1990.11.06 |
申请号 |
US19890448956 |
申请日期 |
1989.12.12 |
申请人 |
THOMSON COMPOSANTS MILITAIRES ET SPATIAUX |
发明人 |
BLANCHARD, PIERRE;BAUSSAND, PATRICK |
分类号 |
H01L29/417;H01L21/339;H01L29/762 |
主分类号 |
H01L29/417 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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