发明名称 Process for fabricating small size electrodes in an integrated circuit
摘要 According to the invention, a first layer of conductive material (11) is submitted to an incomplete etching operation in the presence of a mask (13). After elimination of the mask, a second layer of conductive material is deposited, and the thus-obtained result is submitted to an etching operation without a mask, so allowing the inter-electrode gaps to be reduced. The process provides a very tight electrode configuration, and is particularly suited to charge-coupled devices.
申请公布号 US4968646(A) 申请公布日期 1990.11.06
申请号 US19890448956 申请日期 1989.12.12
申请人 THOMSON COMPOSANTS MILITAIRES ET SPATIAUX 发明人 BLANCHARD, PIERRE;BAUSSAND, PATRICK
分类号 H01L29/417;H01L21/339;H01L29/762 主分类号 H01L29/417
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