| 摘要 |
PURPOSE:To efficiently perform a test by automatically performing the interruption of a test program and the recovery of a device to be tested when the device to be tested goes down, and restarting the test after removing a test unit having a factor which causes the down of the device from a schedule. CONSTITUTION:A down instruction storage means 17 stores a test instruction 23 applied on the device 10 to be tested by the test unit of a test unit group 11 transiently. A test schedule means 18 interrupts the test once when receiving a down detecting signal 21, and a reset means 16 performs resetting on the device 10 to be tested, and outputs a reset success signal 22 when it succeeds in resetting. The test schedule means 18 refers to an every unit instruction storage means 12, and restarts the test after removing the test unit which performs the same test instruction as a down instruction stored in the down instruction storage means 17 out of the test units behind the next test unit. In such a way, it is possible to reduce the man-hours of maintenance and to efficiently perform the test of peripheral equipment. |
