发明名称 Semiconductor device
摘要 A semiconductor device has a well region formed in the surface of a substrate, and has semiconductor elements such as MOSFETs and bipolar transistors formed in the well region. The carrier concentration profile of the well region assumes the shape of a valley in the direction of depth thereof, and a minimum point thereof has a concentration of smaller than 5x1015 cm-3 and is located at a position within 1.6 mu m from the surface of the substrate. Preferably, the minimum point should have a concentration of greater than 5x1014 cm-3 but smaller than 5x1015 cm-3, and more preferably a concentration of greater than 1x1015 cm-3 but smaller than 5x1015 cm-3.
申请公布号 US4963973(A) 申请公布日期 1990.10.16
申请号 US19890323212 申请日期 1989.03.13
申请人 HITACHI, LTD. 发明人 WATANABE, ATSUO;YAZAWA, YOSHIAKI;HIRAISHI, ATSUSHI;MINAMI, MASATAKA;NAGANO, TAKAHIRO;IKEDA, TAKAHIDE;MOMMA, NAOHIRO
分类号 H01L21/8234;H01L21/8238;H01L21/8249;H01L27/06;H01L27/088;H01L27/092;H01L29/78 主分类号 H01L21/8234
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