发明名称 |
Semiconductor device |
摘要 |
A semiconductor device has a well region formed in the surface of a substrate, and has semiconductor elements such as MOSFETs and bipolar transistors formed in the well region. The carrier concentration profile of the well region assumes the shape of a valley in the direction of depth thereof, and a minimum point thereof has a concentration of smaller than 5x1015 cm-3 and is located at a position within 1.6 mu m from the surface of the substrate. Preferably, the minimum point should have a concentration of greater than 5x1014 cm-3 but smaller than 5x1015 cm-3, and more preferably a concentration of greater than 1x1015 cm-3 but smaller than 5x1015 cm-3.
|
申请公布号 |
US4963973(A) |
申请公布日期 |
1990.10.16 |
申请号 |
US19890323212 |
申请日期 |
1989.03.13 |
申请人 |
HITACHI, LTD. |
发明人 |
WATANABE, ATSUO;YAZAWA, YOSHIAKI;HIRAISHI, ATSUSHI;MINAMI, MASATAKA;NAGANO, TAKAHIRO;IKEDA, TAKAHIDE;MOMMA, NAOHIRO |
分类号 |
H01L21/8234;H01L21/8238;H01L21/8249;H01L27/06;H01L27/088;H01L27/092;H01L29/78 |
主分类号 |
H01L21/8234 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|