发明名称 METHOD FOR INSPECTING PATTERN
摘要 PURPOSE:To obviate the leakage of pattern correction by correcting even the inspection patterns at every correction of a segment pattern and visibly displaying the corrected pattern. CONSTITUTION:For example, the patterns are broken down respectively to 3 pieces of the patterns PF 1 to PF 3, PL 1 to PL 3 in such a manner that the operation to correct the pattern width of the inspection patterns and the checking of the leakage from the connections of the inter-pattern spacings can be made. The width (a) of the pattern PL 1 is corrected to a width W in the case of unifying the segment pattern width to the width W and the PF 1 is of the width W from the beginning and is, therefore, not changed by the correction. The width (b) of the pattern PL 2 and the width (c) of the PF 3 are similarly expanded respectively to the W. The spacings (e), (f) below the threshold based on the spacing D are connected in succession thereto. The corrected inspection patterns are thereafter printed and outputted. The missing of the correction is thus visually checked.
申请公布号 JPH02247649(A) 申请公布日期 1990.10.03
申请号 JP19890068367 申请日期 1989.03.20
申请人 FUJITSU LTD;FUJITSU VLSI LTD 发明人 UECHI MASAHITO
分类号 G01R31/302;G03F1/72;G03F1/84;H01L21/027 主分类号 G01R31/302
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