发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve reliability without generating deterioration due to hot carriers while decreasing the number of manufacturing processes by controlling the potential of the base region of a bipolar transistor so as to be conformed to outer potential while using a region of the opposite conductivity type as a control gate. CONSTITUTION:The potential of the base region 12 of a bipolar transistor is controlled so as to be conformed to outer potential when a region 13 being formed in the base region 12 and having a conductivity type opposite to that of the base region 12 is operated as a control gate. Consequently, even when hot carriers A having high energy are generated by an avalanche effect in the base-collector depletion layer of the bipolar transistor, a function as the control gate of the opposite conductivity type region 13 is not subject ton effect by the hot carriers A at all. Accordingly, a semiconductor device, in which deterioration due to the hot carriers A is not generated and which has high reliability and a few manufacturing processes, is acquired.
申请公布号 JPH02246370(A) 申请公布日期 1990.10.02
申请号 JP19890068626 申请日期 1989.03.20
申请人 FUJITSU LTD 发明人 GOTO HIROSHI
分类号 H01L29/68;H01L21/8222;H01L21/8229;H01L21/8248;H01L27/06;H01L27/102 主分类号 H01L29/68
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