发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURE |
摘要 |
PURPOSE: To grow a large area hetero body structure of hierarchized Gex Si1-x alloy having a low-level threading transfer defect on silicon by growing germanium-silicon alloy at a high temperature and increasing the germanium component with a gradient more than a specified value. CONSTITUTION: A silicon substrate 3 is prepared. The substrate is a sort of standard (100) direction silicon wafer generally used for producing an integrated circuit. A large area hierarchized layer 2 of germanium-silicon alloy Gex Si1-x is grown on the silicon substrate 3 at a high temperature. A growing process is chemical vapor deposition(CVD) or molecular beam epitaxy(MBE). A substrate growth starting temperature is in a range of 850 to 1100 deg.C. Thus, the area of hierarchized alloy exceeds 1200 micrometer 2. The start composition is preferably pure silicon. The germanium forms Gex Si1-x with the gradient less than about 25%/micron.
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申请公布号 |
JPH06252046(A) |
申请公布日期 |
1994.09.09 |
申请号 |
JP19920122818 |
申请日期 |
1992.04.17 |
申请人 |
AMERICAN TELEPH & TELEGR CO <ATT> |
发明人 |
DANIERU BUREISEN;YUUJIIN AASAA FUITSUTSUJIERARUDO JIYUNIA;MAACHIN ROORENSU GURIIN;YAAFUN KII |
分类号 |
H01L21/20;H01L21/203;H01L21/205;H01L21/335;H01L21/8258;H01L27/15;H01L33/00;H01L33/38;H01L33/40;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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