发明名称 METHOD AND APPARATUS FOR SPECIFIC SPECTROSCOPIC ATOMIC IMAGING USING COMPLEMENTARY WAVELENGTH SPECIFIC PHOTON BIASING WITH ELECTRONIC AND TEMPERATURE BIASING ON A SCANNING TUNNELING MICROSCOPE
摘要 <p>A method and apparatus (10) for specific spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample (5) surface, but also bonding and the specific atomic species in such bond. The apparatus (10) includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser (54), modulating electronic surface biasing for the sample (5), and temperature biasing, preferably a vibration-free refrigerated sample mounting stage (12). Computer control (100) and data processing and visual display components (102) are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample (5). This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample (5) surface.</p>
申请公布号 WO1990010304(A1) 申请公布日期 1990.09.07
申请号 US1990000098 申请日期 1990.01.08
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