发明名称 |
KIBANJONOHAISENPATAANKENSHUTSUHOHOOYOBISONOSOCHI |
摘要 |
<p>PURPOSE:To make it possible to detect not only a shortcircuit fault low in light reflectivity but also the fault of a wiring pattern of which only the upper part is broken off without falsely reporting the flaw on the wiring pattern as a fault, by using a reflected light detecting system and a fluorescence detecting part in combiniation and utilizing mutual advantages thereof. CONSTITUTION:An infrared reflected ray detector 15' and an infrared ray reflrecting mirror 20 are provided other than a fluorescence detector 19 and light 31 from high brightness light 11 comes to light 32 having a short wavelength easy to generate the fluorescence of the base material of a printed circuit board 1 by a first filter 16 while the light 32 is changed in its direction by a translucent mirror 17 and allowed to irradiate a wiring surface 2. The fluorescence generated from the base material and fluorescence 42 comprising a combination of intensive reflected light having a short wavelength and reflected light due to infrared rays now transmit the translucent mirror 17 and pass a second filter 18 to form light 43, wherein intensive reflected light having a short wavelength is cut while the light 43 is separated into infrared reflected rays 45 and fluorescence 44 by the infrared ray reflecting mirror 20 and a pattern image is obtained by the infrared reflected ray detector 15' and the fluorescence detector 19.</p> |
申请公布号 |
JPH0238885(B2) |
申请公布日期 |
1990.09.03 |
申请号 |
JP19830243850 |
申请日期 |
1983.12.26 |
申请人 |
HITACHI LTD |
发明人 |
HARA YASUHIKO;TSUKAZAKI KOICHI;UJIIE NORIAKI;SASE AKIRA |
分类号 |
H05K3/00;G01B11/24;G01N21/64;G01N21/956 |
主分类号 |
H05K3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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