发明名称 |
Mass Spectrometry/mass spectrometry instrument having a double focusing mass analyzer |
摘要 |
A double focusing mass spectrometer is used as the second mass analyzer of a Mass Spectrometry/Mass Spectrometry Instrument comprising a uniform electric field and a magnetic sector. Fragment ions produced from precursor ions of a certain ionic species are introduced into a uniform electric field. The fragment ions travel along parabolic orbits and are separated according to their respective energy levels. The separated fragment ions are introduced into a magnetic sector and are dispersed according to their mass by the magnetic sector. A two-dimensional ion detector is disposed along a focal plane of the magnetic sector in order to simultaneously detect the fragment ions and to obtain a spectrum of the fragment ions.
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申请公布号 |
US4952803(A) |
申请公布日期 |
1990.08.28 |
申请号 |
US19890449438 |
申请日期 |
1989.12.11 |
申请人 |
JEOL LTD. |
发明人 |
MATSUDA, HISASHI |
分类号 |
H01J49/06;H01J49/26;H01J49/32 |
主分类号 |
H01J49/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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