发明名称 Mass Spectrometry/mass spectrometry instrument having a double focusing mass analyzer
摘要 A double focusing mass spectrometer is used as the second mass analyzer of a Mass Spectrometry/Mass Spectrometry Instrument comprising a uniform electric field and a magnetic sector. Fragment ions produced from precursor ions of a certain ionic species are introduced into a uniform electric field. The fragment ions travel along parabolic orbits and are separated according to their respective energy levels. The separated fragment ions are introduced into a magnetic sector and are dispersed according to their mass by the magnetic sector. A two-dimensional ion detector is disposed along a focal plane of the magnetic sector in order to simultaneously detect the fragment ions and to obtain a spectrum of the fragment ions.
申请公布号 US4952803(A) 申请公布日期 1990.08.28
申请号 US19890449438 申请日期 1989.12.11
申请人 JEOL LTD. 发明人 MATSUDA, HISASHI
分类号 H01J49/06;H01J49/26;H01J49/32 主分类号 H01J49/06
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