发明名称 SURFACE INCLINATION MEASURING INSTRUMENT FOR OPTICAL DEFLECTOR
摘要 PURPOSE:To realize high accuracy and size reduction by calculating the difference between the outputs of two beam position detectors and finding the quantity of surface inclination. CONSTITUTION:The laser beam L1 emitted by a light source 1 is split by a polarization beam splitter(BS) 2 into a horizontal and a vertical component. The vertical polarized laser beam L2 is made incident on the BS 4 as a beam L2a through the optical deflector 3. Further, the horizontal polarized laser light L3 is made incident on the BS 4 as a beam L3a through a mirror M1. Then the composite light L4 projected from the BS 4 is made incident on a BS 5 through mirrors M2 and M3. Then the vertical polarized light L5A transmitted through the BS 5 is made incident on a sensor 6 and the horizontal polarized light L5b which is reflected by the BS 5 is made incident on a sensor 7. Then the sensors 6 and 7 detects the positions of the laser beams and output electric signals A and B. Further, the signals A and B are inputted to a differential output circuit C and the difference between the signals A and B is outputted as a final surface inclination signal.
申请公布号 JPH02210237(A) 申请公布日期 1990.08.21
申请号 JP19890029748 申请日期 1989.02.10
申请人 COPAL ELECTRON CO LTD 发明人 TASHIRO KATSU;YAMAGISHI YASUSHIGE;SUGIZAKI IWAO;HORIKAWA HIROSHI
分类号 G01B11/26;G01M11/00;G02B26/10;G02B26/12 主分类号 G01B11/26
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