发明名称 Semiconductor device having conductive polysilicon layer with wiring pattern and fabrication method thereof.
摘要 <p>The invention relates to such semiconductor devices comprising: a wiring layer with a predetermined pattern formed over a major surface of a semiconductor substrate through an insulating film, a diffusion layer formed under a contact hole formed in said insulating film in an adjacent region of the wiring layer, and a conductive layer deposited into said contact hole in a state of being connected to said wiring layer.</p>
申请公布号 EP0380964(A2) 申请公布日期 1990.08.08
申请号 EP19900100909 申请日期 1990.01.17
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 CHO, SONGSU;HASEGAWA, SHINICHI
分类号 H01L21/768;H01L21/28;H01L21/285;H01L21/336;H01L21/8244;H01L23/485;H01L27/11;H01L29/78 主分类号 H01L21/768
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