发明名称 |
Semiconductor device having conductive polysilicon layer with wiring pattern and fabrication method thereof. |
摘要 |
<p>The invention relates to such semiconductor devices comprising: a wiring layer with a predetermined pattern formed over a major surface of a semiconductor substrate through an insulating film, a diffusion layer formed under a contact hole formed in said insulating film in an adjacent region of the wiring layer, and a conductive layer deposited into said contact hole in a state of being connected to said wiring layer.</p> |
申请公布号 |
EP0380964(A2) |
申请公布日期 |
1990.08.08 |
申请号 |
EP19900100909 |
申请日期 |
1990.01.17 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
CHO, SONGSU;HASEGAWA, SHINICHI |
分类号 |
H01L21/768;H01L21/28;H01L21/285;H01L21/336;H01L21/8244;H01L23/485;H01L27/11;H01L29/78 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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