| 摘要 |
Method for inspecting transparent protective windows 2 covering a plurality of solar cells 3, characterised in that a cold light beam is directed in succession over at least one segment 2A of each of the windows whilst observing the latter, under substantially normal incidence, looking, within the perimeter of this window, for a zone 2' of high brilliance which is characteristic of a defect in this window. <IMAGE>
|
