发明名称 X-ray examination apparatus utilizing an auxiliary adjusting force.
摘要 <p>An adjustable X-ray examination apparatus (24, 26) comprises an auxiliary element (38), for example a weight or a gas spring, in order to compensate for forces generated during operation of drive mechanism formed by parallelogram arms (16, 18, 20, 22). The forces increase with the amount of excursion from a neutral position. The auxiliary element may be mounted and adjusted so that, for the whole range, the positioning of the X-ray examination apparatus can be performed by a substantially constant external force.</p>
申请公布号 EP0377247(A1) 申请公布日期 1990.07.11
申请号 EP19890203285 申请日期 1989.12.21
申请人 N.V. PHILIPS' GLOEILAMPENFABRIEKEN 发明人 VAN DER AA, ANTONIUS GERARDUS;VAN GENECHTEN, THEODORUS JOHANNUS
分类号 A61B6/00 主分类号 A61B6/00
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