发明名称 ELECTRON DETECTOR
摘要 <p>Secondary electrons emitted by a body under electron beam bombardment into the magnetic field of a magnetic electron lens in which the body is placed are constrained and directed by the magnetic field so that the lens either focusses them to a small region at the centre of a hemispherical collector assembly so that the direction of the electrons do not affect their angle of incidence on the collector, or brings their paths to be within a small angle (5 DEG ) of the axis of the lens so that they impinge on a plane collector substantially normally. The invention is of particular value in the electron beam inspection of an integrated circuit when operating.</p>
申请公布号 EP0138610(B1) 申请公布日期 1990.07.04
申请号 EP19840307068 申请日期 1984.10.16
申请人 TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS LIMITED 发明人 GARTH, SIMON CHRISTOPHER JOHN;NIXON, WILLIAM CHARLES
分类号 G01R19/155;G01R19/00;G01R31/28;G01R31/302;G01R31/305;H01J37/244 主分类号 G01R19/155
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