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发明名称
TEST SOCKET FOR SEMICONDUCTOR DEVICE WITH FRAME
摘要
申请公布号
JPH02160391(A)
申请公布日期
1990.06.20
申请号
JP19880314136
申请日期
1988.12.12
申请人
FUKUOKA NIPPON DENKI KK
发明人
MIKAWA FUTOSHI
分类号
G01R31/26;H01R13/64;H01R33/76
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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