发明名称 DEVICE FOR ABRADING WAFER AND POSITIONING JIG USED FOR SUCH DEVICE
摘要 PURPOSE:To enable a wafer surface to be abraded in a high degree of flatness and parallelism by a method wherein the wafer center is held at a position which is made slightly eccentric by a specific amount with respect to the turning center of a wafer holding plate. CONSTITUTION:The turning center of a wafer 3 holding plate 4 is made slightly eccentric from the presumptive wafer center in the wall-thickness direction of the wafer 3 on the diameter in parallel with the maximum gradient direction of the tapered wafer 3 without coincidently fixing the turning center of the plate 4 on the presumptive wafer center. Furthermore, within the wafer 3 having an orifla, the wafer 3 is fixed in such a way that the turning center of the plate 4 may be made slightly eccentric from the presumptive wafer center in the inverse direction to the orifla on the diameter having the orifla. Through these procedures, even when the wafer having a slightly tapered surface or the orifla is to be abraded, the wafer surface can be abraded in high degree of flatness and parallelism.
申请公布号 JPH02159722(A) 申请公布日期 1990.06.19
申请号 JP19880313848 申请日期 1988.12.14
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 TANAKA KOICHI;UCHIYAMA ISAO
分类号 B24B37/04;B24B37/30;H01L21/304 主分类号 B24B37/04
代理机构 代理人
主权项
地址