TESTING CONSTRUCTION FOR MODULE FOR TESTING SIGNAL CHIP HAVING A PLURALITY OF DIFFERENT FUNCTION BLOCKS

摘要

PURPOSE: To perform a test efficiently by enabling a test interface logic means to generate an internal test signal for a selected functional block in response to a test starting signal. CONSTITUTION: Each of a plurality of different functional blocks 16-22 includes a test interface logic means 24 for communicating with a bus interface unit means 12. Also, an address decoder means 38 generates a selection signal for selecting the blocks 16-22 and at the same time generates a test register write signal for setting the selected blocks 16-22 to a test mode. Further, a test generation logic means 40 generates a test register access enable signal in response to a test register write signal. Then, the means 24 transfers direction information to a direction latch means by a bidirectional data bus in response to the test register access enable signal and a read signal and at the same time generates an internal test signal for the selected functional block in response to the test start signal.