| 摘要 |
PURPOSE:To improve working efficiency and to reduce the cost of the title device by obtaining the contact between a rectangle circumscribed to an inspection object pattern and the inspection object pattern, calculating the degree of the inclination of the inspection object pattern, and deciding the normal/ defective condition of the inspection object pattern from the result. CONSTITUTION:For the device, a camera 1, a binarization part 2, a circumscribed rectangle detecting part 4, a contact position detecting part 5, and a deciding part 6 are provided. Further, the rectangle circumscribed to a character 2 is detected from binarized picture data in the circumscribed rectangle detecting part 4, the contact between the circumscribed rectangle and the character 2 is detected in the contact position detecting part 5, and the deciding part 6 compares a contact position detected in the contact position detecting part 5 with the contact position between a previously determined reference character and the circumscribed rectangle and decides the degree of the inclination of the character 2 from the magnitude of the difference between both the contact positions. Thus, the pattern can be inspected, and the normal/defective condition of the pattern can be decided by the simple processing. |
