发明名称 |
Focusing in instruments, such as SEMs and CRTs |
摘要 |
A significantly improved focusing technique is set forth for use with electron beams, particularly in scanning electron microscopes and/or CRTs. This technique utilizes an in-situ differential signal measurement of an object surface to form a signal which is particularly sensitive to edges in the sample at a superimposed frequency. Perfect focus is obtained when the signal strength at the superimposed frequency is a maximum thereby resulting in a minimum spot size.
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申请公布号 |
US4929836(A) |
申请公布日期 |
1990.05.29 |
申请号 |
US19890333059 |
申请日期 |
1989.04.03 |
申请人 |
NORTH AMERICAN PHILIPS CORPORATION |
发明人 |
SICIGNANO, ALBERT;VAEZ-IRAVANI, MEHDI |
分类号 |
G01Q30/02;H01J37/28 |
主分类号 |
G01Q30/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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