| 摘要 |
A wide band large dynamic range current sensor operable to measure current leakage in an external conductor utilizing a magnetostatic spin wave delay line (MSW) device is described. The measurable changes in well known electromagnetic properties of ferrite films, as utilized in MSW devices when these films are exposed to external current induced magnetic fields, results in a current sensitive detection device. A method of current detection using this device is also described. Specific, low power microelectronic applications as well as, high power, local and remote current detecting embodiments are included.
|
