IMPROVED DOUBLE CRYSTAL X-RAY SPECTROMETER,申请号EP19860201900-传众专利搜索

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发明名称	IMPROVED DOUBLE CRYSTAL X-RAY SPECTROMETER
摘要
申请公布号	EP0222442(B1)	申请公布日期	1990.04.11
申请号	EP19860201900	申请日期	1986.10.31
申请人	NORTH AMERICAN PHILIPS CORPORATION	发明人	JENKINS, RONALD;NICOLOSI, JOSEPH;CRUZ, ALVARO
分类号	G01N23/22;G01T1/36;G21K1/06	主分类号	G01N23/22
代理机构		代理人
主权项
地址

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