发明名称 INSTRUMENT FOER KONTROLL AV IC-KRETSAR
摘要 PCT No. PCT/SE89/00489 Sec. 371 Date Feb. 28, 1991 Sec. 102(e) Date Feb. 28, 1991 PCT Filed Sep. 12, 1989 PCT Pub. No. WO90/02926 PCT Pub. Date Mar. 22, 1990.An instrument for checking the operational state of IC-circuits, and particularly for checking the operational state of current-conducting IC-circuits on an electronic card or board, the instrument including an electronic circuit which is operative to control and evaluate signals to and from the pins of the IC-circuit, and further including a test clip which is connected to the electronic circuit and which is intended for connection to the pins of an IC-circuit. The invention is characterized in that the electronic circuit includes a microprocessor (10) which is programmed with logic functions intended for one or more IC-circuits, and further includes a sequence logic circuit (14) which is operative to control so-called switches (15) which, via the test clip (4), can be connected to the pins of the IC-circuits in a sequence predetermined for each IC-circuit. The switches (15) are operative to apply on respective inputs of the IC-circuit a short pulse of high current strength, the high current strength of which pulse is sufficient for the input concerned to adopt a predetermined state, irrespective of the influence exerted on the input by any other circuits that may possibly be connected to the IC-circuit, and the duration of which pulse is of sufficiently short duration to ensure that the IC-circuit will not be damaged at said current strength; and in that the microprocessor (10) is operative to compare output signals which occur in the IC-circuit in response to pulses applied to said IC-circuit with the logic functions of the IC-circuit concerned.
申请公布号 SE461939(B) 申请公布日期 1990.04.09
申请号 SE19880003198 申请日期 1988.09.12
申请人 KJELL MOUM 发明人 KJELL MOUM
分类号 G01R31/317;G01R31/28;G01R31/30;G01R31/319;G01R31/3193;G06F11/22;(IPC1-7):01R31/28;06F11/26 主分类号 G01R31/317
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