发明名称 SILICON WAFER STRAIN FIELD FORMING DEVICE
摘要 PURPOSE:To obtain enough needed for fusion and to obtain slow strength distribution so as to remove scattering of Si by providing an optical system for laser beam reduction between a laser oscillator and a condensing lens, when making fused marks at the rear of an Si wafer by irradiation with excimer laser beams so as to form a strain field. CONSTITUTION:The long-side of the beam cross-section of a laser beam which is emitted from an excimer laser oscillator 1 is reduced with a cylindrical reducer 2. If the output energy of the oscillator 1 is about 100mT per pulse, the reduction ratio is made about 1/3-2/3. Also, the short-side of the reduced laser beam is condensed with a cylindrical lens 3 and is made a long and narrow beam, which is applied to the rear of a wafer 4 so as to yield a strain field. If it is done this way, it can make uniform fused marks with enough strength while removing the scattering of Si, and the strain field becomes uniform.
申请公布号 JPH0291945(A) 申请公布日期 1990.03.30
申请号 JP19880242595 申请日期 1988.09.29
申请人 NEC CORP 发明人 NAKAMURA SHOICHIRO
分类号 B23K26/00;H01L21/322 主分类号 B23K26/00
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