EVALUATION OF MOISTUREPROOF RELIABILITY OF SEMICONDUCTOR DEVICE,申请号JP19880217339-传众专利搜索

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发明名称	EVALUATION OF MOISTUREPROOF RELIABILITY OF SEMICONDUCTOR DEVICE
摘要
申请公布号	JPH0265250(A)	申请公布日期	1990.03.05
申请号	JP19880217339	申请日期	1988.08.31
申请人	OKI ELECTRIC IND CO LTD	发明人	NANBU MASATAKE;TAKEI SHINJI
分类号	G01R31/26;H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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