| 摘要 |
In order to carry out a diagnostic operation after packaging process, there is disclosed a semi-custom-made integrated circuit device fabricated on a semiconductor substrate, comprising a plurality of function blocks each achieving a predetermined function and internal bus system operative to couple the function blocks, and one of the function blocks comprises a control signal generating circuit responsive to external control signals fed from the outside and operative to produce a plurality of internal control signals representing respective commands used for a diagnostic operation carried out on the basis of data information supplied from the outside of the semi-custom-made integrated circuit, so that the diagnostic operation can be carried out after packaging process with a set of information data commonly used among a plural-type of semi-custom-made integrated circuit device. |
