发明名称 Adapter frame for testing printed circuits of high density.
摘要 <p>The invention relates to an adaptor frame for bare printed circuits. This adaptor frame is used to make an electrical connection intended to test the electrical continuity and insulation of the chips and of the conducting tracks of the printed circuit. This adaptor frame comprises two faces, one supporting contacts (12) at the same pitch as the contact surfaces of the printed circuit element to be tested, and the other supporting chips (14) at the same pitch as the points of the probe tester (1) on which the pitch adaptor (8) rests. The face supporting the contacts, at the same pitch as that of the printed circuit to be tested, possesses a radiused part (18) which, when a pressure force is exerted on the printed circuit to be tested, and by virtue of the flexibility and elasticity of the material used to make this pitch adaptor, ensures the electrical connection between the points situated at a pitch of 2.54 mm and the contact surfaces of the bare printed circuit element. &lt;IMAGE&gt;</p>
申请公布号 EP0354080(A1) 申请公布日期 1990.02.07
申请号 EP19890401942 申请日期 1989.07.06
申请人 THOMSON-CSF 发明人 DAGNAC, PIERRE;MOURAREAU, DENIS
分类号 G01R1/073;G01R31/28;H05K1/00;H05K1/14;H05K3/32 主分类号 G01R1/073
代理机构 代理人
主权项
地址