| 摘要 |
PURPOSE:To reduce a chip size by writing ROM data into RAM and making ROM data to be the test pattern of RAM. CONSTITUTION:Since a signal generated from a ROM/RAM test control signal generation circuit 26 sets an R-S flip flop 28, the output becomes 'H', and RAM 2 comes to a write possible state. Data is read from ROM 3 and it is inputted and written into RAM 2 through a data bus 6. The signal is generated from the circuit 26, the flip flop 28 is reset and read RAM data is outputted from an output port 7. A RAM address is outputted from an output port 8. Thus, data can be written into RAM without the necessity of inputting data from an external terminal. Consequently, a private port for test is eliminated and the chip size can be reduced. |
