Coin-testing device

摘要

Coin-testing devices have a coin running track (ML), along which the coins to be tested run past a plurality of coils which are each assigned to an L-C resonant circuit. The coin-testing device is to make do with substantially fewer components in spite of the need for a multiplicity of tests for determining a coin type. The coin-testing device according to the invention has only one coil with a plurality of windings (W1, W2, W3) having different winding diameters. The first winding (W1) having the smallest winding diameter forms a resonant-circuit inductance, the frequency change of the resonant circuit caused as a result of a run-through of a coin (M) and the voltages (UA1, UA2) thus induced via the first winding (W1) into the further windings (W2, W3) being evaluated for the test. <IMAGE>