发明名称 Method for measuring x-rays or gamma radiation and device for this
摘要 According to the invention x-rays, gamma radiation is measured by means of the Compton effect utilizing scattering towards a long and narrow filament of polyethylene, lucite or another material having a low average atomic number. The radiation scattered from the filament (4) is measured by a detector (8) and the radiation to and from, respectively, the filament is shielded by collimators (2,4, 6 and 7). the detector (8) is connected to a multichannel analyzer which, in turn, is connected to a computer performing a reconstruction of the primary radiation from the measured spectrum. The measuring method is practical in use and very accurate.
申请公布号 US4894543(A) 申请公布日期 1990.01.16
申请号 US19880163545 申请日期 1988.03.03
申请人 RIBBERFORS, ROLAND;MATSCHEKO, GEORG 发明人 RIBBERFORS, ROLAND;MATSCHEKO, GEORG
分类号 G01T1/36 主分类号 G01T1/36
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