发明名称 Method of manufacturing field effect transistors and lateral bipolar transistors on the same substrate
摘要 The invention provides a method for manufacturing integrated circuits. For forming circuits incorporating bipolar transistors by CMOS technology for a low cost price, a succession of steps are carried out using only 9 successive masks so as to obtain more particularly a lateral NPN bipolar transistor in a P caisson on an N substrate. The source and drain contacts are made from metal silicide, as well as the base contact. The emitter and collector contacts are made from polycrystalline silicon covered with silicide. The N transistor is self aligned with a low access resistance and a low junction depth. The ionic source and drain implantation of the TMOSP on the one hand and of the bipolar base on the other is common. In addition, the access resistance to the P type transistor and gate covering over the sources and drains of this transistor are minimized while leaving a great latitude of choice for doping of the base of the bipolar transistor.
申请公布号 US4891328(A) 申请公布日期 1990.01.02
申请号 US19860855104 申请日期 1986.04.23
申请人 SOCIETE POUR L'ETUDE ET LA FABRICATION DE CIRCUITS INTEGRES SPECIAUXEFCIS 发明人 GRIS, YVON
分类号 H01L21/225;H01L21/285;H01L21/321;H01L21/768;H01L21/8249 主分类号 H01L21/225
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