发明名称 MANUFACTURE OF SEMICONDUCTOR
摘要 PURPOSE: To eliminate an arbitrary crystal disturbance essentially without losing accuracy by joining a semiconductor to a carrier permanently using a support with a sufficient thickness and then reducing the thickness of the semiconductor. CONSTITUTION: A carrier 2 has parallel main surfaces and is joined to a support 1 with a thickness of at least 1/8 of the maximum dimension of the carrier 2 tentatively and is ground mechanically with a flatness of at least 1/2μm. After a semiconductor 4 is permanently joined to the main surface of the carrier 2 via the main surface, the semiconductor 4 is ground mechanically to a thickness that is thicker than a desired final thickness by 50μm or longer. Then, the semiconductor 4 is alternately ground mechanically and tribochemically to a thickness that is thicker than the final desired layer thickness by at least 10μm. Further, a tribochemical grinding state is performed up to a desired layer thickness of the semiconductor to obtain a desired semiconductor, thus preventing an arbitrary crystal disturbance generated below the semiconductor surface from damaging the functions of the carrier and hence avoiding warpage.
申请公布号 JPH01312828(A) 申请公布日期 1989.12.18
申请号 JP19890089865 申请日期 1989.04.11
申请人 PHILIPS GLOEILAMPENFAB:NV 发明人 YAN HAISUMA;KORUNERISU RUKASU ADEMA;YOHAN HERITSUTO DE BURUIN;TEODORUSU MARUCHINUSU MICHIIRUSEN;HIEISUBERUTASU ADORIANUSU KORUNERUSU MARIA SUPIIRINGUSU
分类号 H01L21/306;H01L21/02;H01L21/18;H01L21/20;H01L21/304;H01L27/12 主分类号 H01L21/306
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