发明名称 PHOTOSENSITIVE COMPOSITION, PATTERN FORMING METHOD USING THE SAME AND POLYMER COMPOUND
摘要 PURPOSE:To obtain the photosensitive composition with a high sensitivity, the pattern forming method using the same and the polymer compd. capable of inducing to radioactive rays with the high sensitivity by composing the photosensitive composition of a specified copolymer and a water-soluble polymer compd. which is capable of allowing it to react with the copolymer and has a reciprocity law failure characteristic. CONSTITUTION:The photosensitive composition is composed of the copolymer contg. at least a water soluble nonphotosensitive monomer unit and a monomer unit having an azide group and an electrolytic functional group, and the water- soluble polymer compd. which is capable of allowing it to react with the copolymer and has the reciprocity law failure characteristic. The compounding amount of a 1st. monomer unit, namely a water-soluble nonphotosensitive monomer unit is preferably 10-40% in the copolymer. The compounding amount of a 2nd. monomer unit is preferably 90-10% in the copolymer. Thus, the photosensitive composition has the high sensitivity and is usable for the production of, for example, a large scale black matrix cathode ray tube, and can be exposed with a short time.
申请公布号 JPH01302348(A) 申请公布日期 1989.12.06
申请号 JP19880134177 申请日期 1988.05.31
申请人 HITACHI LTD 发明人 MORISHITA HAJIME;HAYASHI NOBUAKI;NONOGAKI SABURO;HASHIMOTO MICHIAKI;ITO MASAHITO;NISHIZAWA SHOKO;MIURA SEIJI;ODAKA YOSHIYUKI
分类号 G02B5/20;G03F7/00;G03F7/012;G03F7/26 主分类号 G02B5/20
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