发明名称 TEST SYSTEM
摘要 PURPOSE:To realize the application of an ordinary tester that is available in common to various devices to be tested and to reduce the cost of the related test apparatuses by adding a means to the device to be tested to decode the commands given from the tester and deciding via the tester the hardware quality of the device to be tested based on the coincidence between the test result and the expected value. CONSTITUTION:A ROM 3 contained in a device 1 to be tested decodes the commands received from a tester 2 and at the same time the device 1 is connected to the tester via the serial ports 6 and 7. Then an I/O port 8 of the device 1 is connected to a check terminal 9 of the tester 2. The device 1 decodes the commands received from the tester 2 via the ports 6 and 7 and supplies the test result obtained by the command of the tester 2 to this tester via the port 7 or 8. The tester 2 decides the hardware quality of the device 1 based on the coincidence between the test result and the prescribed expected value. In such a way, a general-purpose tester is used. Thus it is possible to reduce the cost of the devices related to the test and also to confirm the test result via an output device of the tester 2.
申请公布号 JPH01300348(A) 申请公布日期 1989.12.04
申请号 JP19880132141 申请日期 1988.05.30
申请人 FANUC LTD 发明人 SEKI MAKI;TAKEGAHARA TAKASHI;SATO SHUJI
分类号 G01R31/28;G06F11/22;G06F11/273;G06F13/00 主分类号 G01R31/28
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