发明名称 Contact structure for connecting electrode to a semiconductor device and a method of forming the same.
摘要 <p>A contact structure for connecting a semiconductor device to a wiring electrode comprises a semiconductor layer (11) forming a part of the semiconductor device, a first contact layer (17a) of reduced resistivity for covering a surface of the semiconductor layer, an insulating structure (18, 19) provided on the first contact layer so as to bury the first contact layer underneath, a penetrating hole (20) opened through the insulating structure so as to expose a part of the first contact layer, a second contact layer (17b) of reduced resistivity provided on the part of the first contact layer exposed by the penetrating hole, in which the second contact layer extends from a bottom of the penetrating hole along its side wall, and a conductor layer (22) forming the wiring electrode provided on the second contact layer.</p>
申请公布号 EP0343667(A2) 申请公布日期 1989.11.29
申请号 EP19890109461 申请日期 1989.05.26
申请人 FUJITSU LIMITED 发明人 NISHIDA, KENJI;SATO, NORIAKI
分类号 H01L29/43;H01L21/28;H01L21/285;H01L21/336;H01L21/60;H01L23/485;H01L23/532 主分类号 H01L29/43
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