发明名称 Method for downhole measurement of formation parameters.
摘要 <p>An apparatus for downhole measurement of formation parameters utilises a sonde (10) with a microwave transmitting antenna (30) and receiving antenna (32), with measuring means (52) for measuring signals transmitted between the antennae and through the formations, and means (24) for determining formation parameters from the measurements. In a method of measuring the formation parameters, the measurements are used to determine an equivalent circuit representative of the formation between the transmitter antenna and receiver antenna; the equivalent circuit encodes valuations of resistivity, dielectric constant and magnetic permeability of the formation material. Multiple measurements can be made in a given formation, and the sonde can be moved steadily or periodically to make measurements at selected locations. Formation electrical parameters in adjacent formations can then be determined.</p>
申请公布号 EP0342920(A2) 申请公布日期 1989.11.23
申请号 EP19890304924 申请日期 1989.05.16
申请人 HALLIBURTON COMPANY 发明人 RAU, RAMA N.
分类号 G01V3/30 主分类号 G01V3/30
代理机构 代理人
主权项
地址
您可能感兴趣的专利