发明名称 LONG WAVELENGTH X-RAY DIFFRACTOMETER
摘要 <p>Long wavelength X-ray diffractometer. A long wavelength diffractometer is provided with an X-ray tube providing long wavelength radiation to a pre-sample monochromometer which diffracts X-radiation onto a sample. The use of long wavelength X-radiation allows measurement of "d" values of about 2 times greater than normal with very low intrinsic background.</p>
申请公布号 CA1262781(A) 申请公布日期 1989.11.07
申请号 CA19860525628 申请日期 1986.12.17
申请人 NORTH AMERICAN PHILIPS CORPORATION 发明人 JENKINS, RONALD;NICOLOSI, JOSEPH
分类号 G01N23/207;(IPC1-7):G01N23/207 主分类号 G01N23/207
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