发明名称 Method for measuring film thickness.
摘要 <p>A method for measuring a film thickness, comprising feeding a sheet 3 to be measured by a rotary shaft 1 in intimate contact, providing a light shield 2 parallel to the axis of the rotary shaft at a predetermined distance from the rotary shaft surface to define a gap therebetween, scanning the gap with a laser beam 4a by a reflector 6, and measuring the time during which the laser beam passes through the gap to determine the film thickness of the sheet to be measured. A different-diameter portion 17 is provided at an end of the shaft, and the difference between the time during which the laser beam passes through the gap on the different-diameter portion and the time during which the laser beam passes through the gap on the portion of the rotary adjacent to the different-diameter portion in the absence of a sheet to be measured is determined. The time during which the laser beam passes through between the surface of the sheet to be measured and the light shield is corrected by utilizing the calculated difference, to obtain the thickness of the sheet to be measured. Methods of error compensation and thickness measurement using the shaft surface as a reference are also disclosed.</p>
申请公布号 EP0339985(A2) 申请公布日期 1989.11.02
申请号 EP19890304179 申请日期 1989.04.26
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TOKUMARU, MAKOTO ITAMI SEISAKUSHO MITSUBISHI DENK;NAGAO, TOSHISHIGE ITAMI SEISAKUSHO;ARIKI, MASAYUKI ITAMI SEISAKUSHO MITSUBISHI DENKI;NAKANO, HIDEKI ITAMI SEISAKUSHO MITSUBISHI DENKI
分类号 G01B11/06 主分类号 G01B11/06
代理机构 代理人
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