发明名称 METHOD AND APPARATUS FOR WAFER POLISHING
摘要 PURPOSE:To enable accurately polish a wafer into plane form, by polishing the wafer held in a polishing chuck with a part thereof sticking out from a polishing surface plate or a polishing cloth. CONSTITUTION:Each polishing chuck 4 holds one semiconductor wafer 5, which is polished with a part thereof sticking out from a polishing surface plate 1 or a polishing cloth 3. For example, the semiconductor wafer 5 to be polished is held by the polishing chuck 4 by vacuum absorption or any other means, rotating the polishing chuck 4 with a motor 9 forces the semiconductor wafer 5 to rotate together with the polishing chuck 4 at a rotating speed n and presses the wafer 5 on the polishing cloth 3 on the polishing surface plate 1 forcibly rotated by a motor 2 at a rotating speed N. The semiconductor wafer 5 in this state rotates together with the polishing chuck 4 at a rotating speed n while reciprocating in the direction of the diameter of the polishing surface plate 1 and is polished by the friction between said wafer and the polishing cloth 3, with a part thereof sticking out from the polishing cloth 3 in the inside and outside of the polishing surface plate 1.
申请公布号 JPH01268032(A) 申请公布日期 1989.10.25
申请号 JP19880095505 申请日期 1988.04.20
申请人 HITACHI LTD 发明人 YUI HAJIME;SHIMURA TAKASHI;NONAKA MASAHIKO
分类号 H01L21/304 主分类号 H01L21/304
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