发明名称 TOTAL REFLECTION ABSORPTION SPECTRUM MEASURING APPARATUS
摘要 <p>PURPOSE:To reduce the number of working steps on a sample to the minimum possible by forming a total reflection surface at the tip of a conducting member while a light emitting element and a light receiving element are arranged at the rear end thereof. CONSTITUTION:Light from a light emitting element 5 is incident on a photoconductive material 1 from an incident surface and reflected in multiplicity to reach the tip end thereof. The light is totally reflected on a plane 8 at the front end of the photoconductive material and transmitted to the side of a light receiving element 7 through a photoconductive material body 2, emitted from an outgoing surface 4 to be incident on a spectroscope 10 and the outgoing light is incident on the light receiving element 7 to measure spectrum with a spectrum analyzer 6. Under such a condition, when a sample is brought into contact with the plane 8, light with a specified wavelength is absorbed by the sample thereby accomplishing measurement of an absorption spectrum of the sample.</p>
申请公布号 JPH01248039(A) 申请公布日期 1989.10.03
申请号 JP19880077926 申请日期 1988.03.29
申请人 SHIMADZU CORP 发明人 SUZUKI KOJI
分类号 G01N21/27;G01N21/552 主分类号 G01N21/27
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