发明名称 AUTOMATIC GENERATION SYSTEM FOR TEST PATTERN
摘要 PURPOSE:To generate a microprogram which satisfies timing specification by replacing respective steps of a high-class language with corresponding microprograms simply, and then performing parallel conversion processing and decreasing the number of steps. CONSTITUTION:In microprogram generation processing, a source program written in high-class language is interpreted to assign registers, generate microinstructions corresponding to input/output statements of the high-class language, and generate microinstructions such as branch condition instructions and increment instructions for control variables. Those are generated so that one instruction is generated in one step. Then the parallel conversion processing is performed. Namely, while execution sequence restriction relation among various instructions is referred to, respective instructions in a microprogram are moved as forward in the program as possible beyond the limit of steps. Consequently, when the microprogram to be processed can be made parallel, the number of steps is decreased, the number of steps between test signal output instructions is reduced, and the timing specification is satisfied.
申请公布号 JPH01242976(A) 申请公布日期 1989.09.27
申请号 JP19880069341 申请日期 1988.03.25
申请人 HITACHI LTD 发明人 SUZUKI KENJI;KASAI SHIGENORI;FUJITA NAOMI
分类号 G01R31/28;G06F11/22;G06F17/50;G11C29/10 主分类号 G01R31/28
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