发明名称 MEASURING METHOD FOR SURFACE STATE
摘要 <p>PURPOSE:To enable the on-line monitoring of the kind of an extraneous substance on a surface and the cleaness thereof and to improve the efficiency of production and the yield thereof based on fed-back informations, by measuring the surface by using the correlation between the intensity ratio of a reflected light and the properties of the surface of an object to be measured. CONSTITUTION:A light is applied from a light source onto a hot-rolled steel plate 10 after acid pickling, and then it is branched into three optical paths by using half mirrors 14 and 16. Branched lights are passed through optical filters 18, 20 and 22 and received by optical detectors 24, 26 and 28, whereby the intensities of reflected lights having prescribed wavelengths are detected respectively. Each detection value obtained from measurement is led to an operating device 30 storing an output value of each detector in relation to an object having the best cleaness of the surface, the discrimination of an extraneous substance on the surface and the measurement of the cleaness thereof are performed therein, and the results are displayed in a display unit 32. Since this method enables the discrimination of the extraneous substance on the surface of the object to be measured and the measurement of the cleaness of the surface thereof in a very short time, it is effective for performing the measurement on-line, and the efficiency of production and the yield thereof can be improved by feeding back the result of the measurement to operations.</p>
申请公布号 JPS58172504(A) 申请公布日期 1983.10.11
申请号 JP19820054930 申请日期 1982.04.02
申请人 KAWASAKI SEITETSU KK 发明人 TORAO AKIRA;ASANO YUUICHIROU;KURITA KUNIO
分类号 B21C51/00;G01B11/24;G01B11/245;G01N21/94 主分类号 B21C51/00
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