发明名称 APPARATUS AND METHOD FOR OBTAINING SURFACE PROFILOMETRY AND THREE DIMENSIONAL SURFACE CONTOUR
摘要 <p>APPARATUS AND METHOD FOR OBTAINING SURFACE PROFILOMETRY AND THREE DIMENSIONAL SURFACE CONTOURS Phase measurements of deformed grating images are used in performing improved optical profilometry. In one embodiment, phase differences between images of an object and a reference plane are used to obtain a measure of the object height. In another embodiment, line profiles are obtained at a series of rotational increments of a body. A full 360 degree surface profile, or a portion thereof, can then be generated.</p>
申请公布号 CA1261656(A) 申请公布日期 1989.09.26
申请号 CA19850490734 申请日期 1985.09.13
申请人 NEW YORK INSTITUTE OF TECHNOLOGY 发明人 HALIOUA, MAURICE;SRINIVASAN, VENUGOPAL
分类号 G01B11/25;(IPC1-7):G01B11/24;G01B9/02 主分类号 G01B11/25
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