发明名称 CHIP COMPONENT INSPECTING INSTRUMENT
摘要 PURPOSE:To eliminate the influence of the reflection of light, a shadow, etc., due to illumination and peripheral electronic parts and to stabilize recognition by calculating a three primary colors RGB distribution vector possessed by every point and grasping the change of the vector. CONSTITUTION:A one-dimensional RGB data memory 6 stores the respective data of three primary colors obtained by extracting the respective one- dimensional data of the three primary colors to be primary data for an inspection from the above-mentioned RGB picture memory 3 at an extracting part 5 by using the data of a CAD data memory 4. Thereafter, a color distribution vector changing angle calculating part 7 calculates the changing angle of the color distribution vector of the three primary colors RGB vector in each picture element from the data of the one-dimensional RGB data memory 6. In this manner, the misregistration quantity of a chip component is calculated, and the mounted state of the chip component is outputted. Thus, the position of the chip component can be accurately judged.
申请公布号 JPH01236379(A) 申请公布日期 1989.09.21
申请号 JP19880063872 申请日期 1988.03.16
申请人 NEC CORP 发明人 INEZUMI HITOSHI
分类号 G01N21/88;G01N21/93;G06T1/00;H05K13/08 主分类号 G01N21/88
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