PATTERN GENERATOR FOR SEMICONDUCTOR INTEGRATED CIRCUIT TESTER,申请号JP19880063937-传众专利搜索

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发明名称	PATTERN GENERATOR FOR SEMICONDUCTOR INTEGRATED CIRCUIT TESTER
摘要
申请公布号	JPH01235874(A)	申请公布日期	1989.09.20
申请号	JP19880063937	申请日期	1988.03.16
申请人	ADVANTEST CORP	发明人	HIRAKATA YOSHIHARU
分类号	G01R31/3183;G01R31/28;G11C29/00;G11C29/10;H01L21/66	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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