发明名称 |
Method and apparatus for splitting up semiconductor ingots into semiconductor wafers with at least one plane surface |
摘要 |
The invention relates to a method of producing wafers by cutting off monocrystalline or polycrystalline semiconductor ingots by means of a wire-cable saw, in which method the end face of the semiconductor ingot is in each case provided with a plane surface by means of a machining step before the cutting-off of each wafer to produce a plane reference surface for the further processing of this wafer. A plane end face is advantageously produced by grinding. Furthermore, the invention relates to an apparatus for carrying out the above method. It consists of a combination of a wire-cable saw with a grinding device which permits grinding in the work set-up of the wire-cable saw. The grinding device expediently forms a unit with the wire-cable saw. In this arrangement, the grinding of the end face of the ingot and the cutting-off of a further wafer can be carried out in succession by means of a wire-cable saw. The grinding of the end face of the ingot and the cutting-off of a further wafer are advantageously carried out in such a way that they are timed to overlap and while utilising the same feed movement.
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申请公布号 |
DE3844520(A1) |
申请公布日期 |
1989.09.14 |
申请号 |
DE19883844520 |
申请日期 |
1988.02.17 |
申请人 |
GMN GEORG MUELLER NUERNBERG AG, 8500 NUERNBERG, DE |
发明人 |
HINZEN, HUBERT, DR., 8501 ECKENTAL, DE |
分类号 |
B24B7/22;B24B27/06;B28D1/00;B28D5/04 |
主分类号 |
B24B7/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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