发明名称 Method and apparatus for splitting up semiconductor ingots into semiconductor wafers with at least one plane surface
摘要 The invention relates to a method of producing wafers by cutting off monocrystalline or polycrystalline semiconductor ingots by means of a wire-cable saw, in which method the end face of the semiconductor ingot is in each case provided with a plane surface by means of a machining step before the cutting-off of each wafer to produce a plane reference surface for the further processing of this wafer. A plane end face is advantageously produced by grinding. Furthermore, the invention relates to an apparatus for carrying out the above method. It consists of a combination of a wire-cable saw with a grinding device which permits grinding in the work set-up of the wire-cable saw. The grinding device expediently forms a unit with the wire-cable saw. In this arrangement, the grinding of the end face of the ingot and the cutting-off of a further wafer can be carried out in succession by means of a wire-cable saw. The grinding of the end face of the ingot and the cutting-off of a further wafer are advantageously carried out in such a way that they are timed to overlap and while utilising the same feed movement.
申请公布号 DE3844520(A1) 申请公布日期 1989.09.14
申请号 DE19883844520 申请日期 1988.02.17
申请人 GMN GEORG MUELLER NUERNBERG AG, 8500 NUERNBERG, DE 发明人 HINZEN, HUBERT, DR., 8501 ECKENTAL, DE
分类号 B24B7/22;B24B27/06;B28D1/00;B28D5/04 主分类号 B24B7/22
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