LOW-TEMPERATURE TESTING INSTRUMENT,申请号JP19880039186-传众专利搜索

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发明名称	LOW-TEMPERATURE TESTING INSTRUMENT
摘要
申请公布号	JPH01213543(A)	申请公布日期	1989.08.28
申请号	JP19880039186	申请日期	1988.02.22
申请人	CHINO CORP	发明人	ITO KENJI;SUDA MASAKI
分类号	G01N1/28;F25B49/00;G01N3/18	主分类号	G01N1/28
代理机构		代理人
主权项
地址

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