| 摘要 |
PURPOSE:To test plural IC cards even when an impressing pattern is interrupted by simultaneously reading output patterns stored in all the control means and deciding the quality of the output patterns when both the output patterns and the comparison patterns of the respective IC cards are coincident. CONSTITUTION:Periodic test patterns are constantly supplied from a pattern generator 11 to plural IC cards 141-14n. Further, the comparison patterns are also supplied to one input sides of coincidence detecting circuits 151-15n in control means 211-21n. A circuit 15k (k=1-n) compares the output pattern and the comparison pattern of an IC card 14k and continuously stores the patterns in a memory 25k in the control means 211-21n connected to the back steps of the IC cards 141-14n when the above-mentioned two patterns are coincident. Thereafter, when an all coincidence detecting circuit 16 detects that the output patterns and the comparison patterns are coincident for all the IC cards, the output data stored in the respective control means 211-21n are read simultaneously. Since the quality of the IC cards is decided after that, even the plural IC cards, the internal states of which cannot be secured when the impressing pattern is interrupted, can be tested even at the time of the interruption of the impressing pattern. |
