发明名称 IC TEST SYSTEM
摘要 PURPOSE:To shorten the time to make a device test by making the operation at the same time if settlement contents for a condition, specification, etc., of an I.C. test program are the same, and if the settlement contents are different, making the operation with the programming part corresponding to each station. CONSTITUTION:In case the settlement contents for the condition, specification and measurement of the I.C. test program 2 which is performed at each of 1st and 2nd stations 3, 4 are the same, each station 3, 4 is made to be operated at the same time respectively. If any of the settlement contents is different, the program 2 is used, which is provided with a sequence such as each station is made to operate with the programming part corresponding to each station. With this arrangement, the testing time can be shortened in case of making the device test at the different stations.
申请公布号 JPH01203983(A) 申请公布日期 1989.08.16
申请号 JP19880029207 申请日期 1988.02.10
申请人 MITSUBISHI ELECTRIC CORP 发明人 YAMAMOTO TAKASHI
分类号 G01R31/26;G01R31/28;G06F11/22 主分类号 G01R31/26
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